In recent years, 3D optical measuring systems are spreading at increasing rate and begin to erode the market of traditional, contact measuring systems. This fact is easily explained when comparing their features.
Acquisition rate (throughput): contact measurement ranges from less than one point per second (for single contact machines) to thousands of points per second (for scanning), while optical measurement ranges from thousands to millions of points per second. Less time spent in measurement means more productivity and often the possibility to verify 100% of the production instead of sampling.
Measuring volume: usually contact measuring machines have a fixed measuring volume, that is the size of measurable objects is limited. Portable CMMs can be displaced to measure large objects, but patching together results obtained in different position is not a trivial task. On the other hand, optical measurements can easily be patched together (eg by means of 'markers'), and laser trackers can have measuring ranges up to kilometers.
Complexity and reliability: a contact measuring machine has many moving parts, subject to wear, and several different subsystem: mechanical, pneumatic, electric, electronic. Optical measuring machines have few or no moving part; their complexity lies mainly in software and their failure probability is low.
Safety: no contact, no moving parts means no possibility to damage the object being measured nor the operator.
Precision: contact measurement ranges from submicron to tens of microns, while optical measurement ranges from microns to millimeters. Anyway it must be said that only a minority of applications needs a micron or submicron precision; in most cases, the precision delivered by optical measurement is more than sufficient.
However the development of a vision based measuring system presents several challenges, which are not found (or, at least, not all together) in other optical systems:
A first classification of vision based measuring systems takes into account feature extraction. We have passive feature extraction when the object exhibits well recognizable features, by its nature as in the case of cuts on a metal sheet, or thanks to adhesive or magnetic markers; we have active feature extraction when features are artificially created on a smooth surface by projecting some pattern of light.
A second classification deals with methods for matching corresponding features in different images. This can be done manually, by asking the operator to select corresponding features, or automatically. In this second case we must exploit some kind of similarity between features (eg their orientation) and some intrinsinc constraints: uniqueness (the correspondence of features is one-to-one) and continuity. Examples are sampling of disparity space, dynamic programming and Marr-Poggio matching.
If features are artificially obtained by projecting a suitable light pattern, there are in turn several possibilities. The light pattern can be modulated in space (sinusoidal intensity shape) so that correspondences can be obtained by determining their phase; or it can simply consist of 'light blades', with abrupt transitions light/dark; or it can be a 'coded' pattern, where correspondences are obtained by matching the codes.
A third classification concerns the calibration method. In order to perform measurements the optical system must be calibrated; that is, its intrinsic parameters (pixel size and slant, position of the optical centre, distortion coefficients) and extrinsic parameters (relative positions and orientations of the cameras) must be known. Such parameters can be obtained by reading a suitable, certified pattern before measurements, or they can be obtained during measurement ('self calibration') by matching a sufficient number of corresponding points, of which only a few have known distances. Self calibration is particularly suitable for wide fields of measure, where a very large certified calibration pattern would not be practical.
| How does EyeGauge (figure 1) fit inside the scene of three-dimensional vision based metrology? We have some technical innovation; as an example, calibration is performed with a proprietary nonlinear bundle adjustment algorithm taking into account all parameters (intrinsic, extrinsic and distortion) at once. The result is a precise calibration with an effective distortion correction (several radial and decentering coefficients) allowing to work with normal quality lenses, even short focus. For applications where the 3D reconstruction must really be fast, eg in-line metrology, EyeGauge can take advantage of the fact that the kind of computations performed are very suitable for parallelization. Parallel number crunchers like the new nVidia ® Tesla ® GPUs speed up the reconstruction of about two orders of magnitude. |
figure 1: An axonometric view of the measuring head, trinocular version, via EyeGauge |
The most notable strength of EyeGauge is anyway its flexibility. The same product can manage both objects exhibiting well recognizable edges, like cut metal sheets (figure 2), even bent or cast, and smooth surfaces (figure 3), just by varying the type of illumination, which is uniform in the first case and 'shaped' (light blades) in the second. In both cases, illuminators or pattern projectors made by Opto Engineering are the best choice.
![]() figure 2: Sample metal sheet with cuts of various shapes |
![]() figure 3: Cloud of points from a high relief |
Moreover, EyeGauge doesn't came with a fixed measuring volume. The cameras can easily be reoriented and recalibrated for volumes ranging from a few cubic centimeters to 600x400x200 mm; and at the time of writing (December 2008) we are completing the self-calibration feature, for measurement of large surfaces with projected patterns used both for calibration (together with a linear scale) and measurement.